We are proud to be sponsoring and exhibiting at The Sixth International Conference on Tip-Enhanced Raman Spectroscopy (TERS-6), from 16-18 August 2017.
The event brings together government, academic and industrial researchers interested in the latest measurement developments in this complex and exciting field.
The meeting addresses both the fundamentals and the applications of TERS, with special emphasis on spatial resolution, enhancement, improvements in reliability, comparability, robustness and methodology.
The scientific program will include invited and contributed talks, industry presentations and training sessions, and poster sessions.
The TERS series began at the National Physical Laboratory (NPL) in the UK 2009, and since then it has been gathering a growing number of scientists from around the world. The last meeting TERS-5 was held in Japan.
TERS-6 will be held just outside Washington DC at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD USA.
The conference and exhibition runs from 16-18 August 2017
More information can be found on the conference website:
